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(123)I标记的Hoechst 33342衰变诱导的DNA双链断裂:DNA拓扑结构的作用

DNA double-strand breaks induced by decay of (123)I-labeled Hoechst 33342: role of DNA topology.

作者信息

Balagurumoorthy Pichumani, Wang Ketai, Adelstein S James, Kassis Amin I

机构信息

Department of Radiology, Harvard Medical School, Boston, MA, USA.

出版信息

Int J Radiat Biol. 2008 Dec;84(12):976-83. doi: 10.1080/09553000802512568.

Abstract

PURPOSE

To determine double-strand-break (DSB) yields produced by decay of minor-groove-bound (123)I-labeled Hoechst 33342 ((123)IEH) in supercoiled (SC) and linear (L) forms of pUC19 DNA, to compare strand-break efficiency of (123)IEH with that of (125)IEH, and to examine the role of DNA topology in DSB induction by these Auger electron emitters.

MATERIALS AND METHODS

Tritium-labeled SC and L pUC19 DNA were incubated with (123)IEH (0-10.9 MBq) at 4 degrees C. After (123)I had completely decayed (10 days), samples were analyzed on agarose gel, and single-strand-break (SSB) and DSB yields were measured.

RESULTS

Each (123)I decay in SC DNA produces a DSB yield of 0.18 +/- 0.01. On the basis of DSB yields for (125)IEH (0.52 +/- 0.02 for SC and 1.62 +/- 0.07 for L, reported previously) and dosimetric expectations, a DSB yield of approximately 0.5 (3 x 0.18) per (123)I decay is expected for L DNA. However, no DSB are observed for the L form, even after approximately 2 x 10(11) decays of (123)I per microg DNA, whereas a similar number of (125)I decays produces DSB in approximately 40% of L DNA.

CONCLUSION

(123)IEH-induced DSB yield for SC but not L DNA is consistent with the dosimetric expectations for Auger electron emitters. These studies highlight the role of DNA topology in DSB production by Auger emitters and underscore the failure of current theoretical dosimetric methods per se to predict the magnitude of DSB.

摘要

目的

确定小沟结合型(123)I标记的Hoechst 33342((123)IEH)在超螺旋(SC)和线性(L)形式的pUC19 DNA中衰变产生的双链断裂(DSB)产率,比较(123)IEH与(125)IEH的链断裂效率,并研究DNA拓扑结构在这些俄歇电子发射体诱导DSB中的作用。

材料与方法

将氚标记的SC和L pUC19 DNA与(123)IEH(0 - 10.9 MBq)在4℃下孵育。(123)I完全衰变后(10天),在琼脂糖凝胶上分析样品,并测量单链断裂(SSB)和DSB产率。

结果

SC DNA中每次(123)I衰变产生的DSB产率为0.18±0.01。根据先前报道的(125)IEH的DSB产率(SC为0.52±0.02,L为1.62±0.07)以及剂量学预期,预计L DNA每次(123)I衰变的DSB产率约为0.5(3×0.18)。然而,即使在每微克DNA约2×10(11)次(123)I衰变后,L形式中也未观察到DSB,而相似数量的(125)I衰变在约40%的L DNA中产生DSB。

结论

(123)IEH诱导的SC而非L DNA的DSB产率与俄歇电子发射体的剂量学预期一致。这些研究突出了DNA拓扑结构在俄歇发射体产生DSB中的作用,并强调了当前理论剂量学方法本身无法预测DSB的大小。

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