散裂中子源的飞行时间背散射光谱仪，即BASIS。

A time-of-flight backscattering spectrometer at the Spallation Neutron Source, BASIS.

作者信息

Mamontov E, Herwig K W

机构信息

Neutron Scattering Science Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.

出版信息

Rev Sci Instrum. 2011 Aug;82(8):085109. doi: 10.1063/1.3626214.

DOI:10.1063/1.3626214

PMID:21895277

Abstract

We describe the design and current performance of the backscattering silicon spectrometer (BASIS), a time-of-flight backscattering spectrometer built at the spallation neutron source (SNS) of the Oak Ridge National Laboratory (ORNL). BASIS is the first silicon-based backscattering spectrometer installed at a spallation neutron source. In addition to high intensity, it offers a high-energy resolution of about 3.5 μeV and a large and variable energy transfer range. These ensure an excellent overlap with the dynamic ranges accessible at other inelastic spectrometers at the SNS.

摘要

我们描述了背散射硅谱仪（BASIS）的设计和当前性能，它是一台在橡树岭国家实验室（ORNL）的散裂中子源（SNS）建造的飞行时间背散射谱仪。BASIS是安装在散裂中子源的第一台基于硅的背散射谱仪。除了高强度外，它还具有约3.5 μeV的高能量分辨率以及大且可变的能量转移范围。这些确保了与SNS其他非弹性谱仪可达到的动态范围有出色的重叠。