Critical assessment of charge mobility extraction in FETs.
作者信息
Choi Hyun Ho, Cho Kilwon, Frisbie C Daniel, Sirringhaus Henning, Podzorov Vitaly
机构信息
Department of Physics, Rutgers University, 136 Frelinghuysen Road, Piscataway, New Jersey 08854, USA.
Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, South Korea.
出版信息
Nat Mater. 2017 Dec 19;17(1):2-7. doi: 10.1038/nmat5035.
DOI:10.1038/nmat5035
PMID:29255225
Abstract
摘要
Zotero 插件